RealNano is an ambitious 36-month project that will develop rapid real-time nano-characterization materials tools & methodologies based on Spectroscopic Ellipsometry, Raman Spectroscopy, Imaging Photoluminescence and Laser Beam Induced Current Mapping that will be integrated to in-line R2R (Roll-to-Roll) Printing and OVPD (Organic Vapor Phase Deposition) Pilot-to-Production Lines (PPLs) for characterization of Organic & Printed Electronics (OE) nano- materials, layers, devices and products during their manufacturing. It will bring Digital Intelligence to manufacturing by combining, fast and non-destructive characterization tools and methodologies (high speed resolution at nanoscale, capable for multiple integration, advanced data management and analysis), to provide robust information and quality control on the nanomaterial properties and products quality, reliable manufacturing, without affecting the process. Objectives: O1. Develop rapid and real-time nanoscale, multi- modal & scale characterization tools/methodologies for OEs O2. Integrate the non-destructive nano-characterization tools in in-line R2R printing and OVPD PPLs O3. Develop characterization Protocols and Data Management for interoperability across industries O4. Demonstrate the tools in industrial OE processes for improvement of quality and reliability of products O5. Validation of OE product quality and manufacturability on commercial applications O6. Effective Transfer of results to industry by Open Innovation (Dissemination, Training, Networking/Clustering) and Management RealNano will revolutionize industrial manufacturing by strongly improving the speed of the characterization procedures in terms of performance (non-destructive with nm-scale resolution in ms time) and reliability (measure/analyze OE nanolayers over large areas). The in-line implementation to PPLs will achieve significant reduction of process time and resources needed to manufacture high quality OE products.